Type:
Category:
Volume:
4(3)
Pages:
Online
Year:
1996
Publisher:
Journal of Statistics Education
URL:
http://www.amstat.org/publications/jse/v4n3/rhiel.html
Abstract:
In this article we investigate the large-sample/small-sample approach to the one-sample test for a mean when the variance is unknown, using the probability of a Type I error as the criterion of interest. We show that in most cases using a t-test (t critical value) provides a more robust test than does using the z-test (standard normal critical value). The only case in which z has some advantage is when using a small sample from a parent population with extremely high kurtosis or with skewness in the direction of the rejection region tail. The implications for teaching the large-sample/small-sample approach in introductory statistics classes are discussed in light of these findings.
The CAUSE Research Group is supported in part by a member initiative grant from the American Statistical Association’s Section on Statistics and Data Science Education